AdvancedEngineering trackUS-CP-04
Wafer Defect Detection with Computer Vision
Detect and classify wafer defects from inspection imagery, reporting per-defect-class recall and deployment latency.
10 Guided Steps480h Internship TierSubmit: GitHub repo or evidence pack + live demo / report + README + milestone logbookVerified CertificateAI Rubric Graded
Program Overview
Detect and classify wafer defects from inspection imagery, reporting per-defect-class recall and deployment latency.
What you submit
GitHub repo or evidence pack + live demo / report + README + milestone logbook
How it is graded
Signals: Milestone gates met; measurable result reported; documentation; deployment or evidence reachable; reflective log
- Functionality & requirements30
- Technical quality & architecture25
- Documentation15
- Deployment & evidence15
- Innovation10
- Presentation5
Pass 60% · Merit 75% · Distinction 90%
Learning Outcomes
480-hour United States programme. Semiconductor firms compete directly with AI hardware companies for this exact skill set.
Target Audience
Engineering Students
Diploma, B.Tech, B.E., BCA, MCA, or M.Tech students seeking practical experience.
Aspiring Developers
Developers who want to build proof-of-work capstone projects for tech resumes.
Job Seekers
Graduates looking for AI-evaluated code review & verified industry credentials.